| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a visual examination method capable of detecting not only a local flaw but also a global defect. <P>SOLUTION: First, the local flaws such as relatively small spots or line flaws or the like are detected by judging the flaws of the respective small regions of the inspection image obtained by photographing an examination target. A new examination image of low resolving power is formed using the density average value of the respective small regions and the flaws of the respective small regions formed by dividing the new examination image of low resolving power are judged to detect the global flaw such as a relatively large stain or contaminant, color irregularity, pattern feeling inferiority, color difference, etc. <P>COPYRIGHT: (C)2007,JPO&INPIT |
