发明名称 ANISOTROPIC ETCHING METHOD FOR SILICON
摘要 PROBLEM TO BE SOLVED: To provide an anisotropic etching method by plasma on a silicon substrate, using an etching mask that makes it possible to obtain a notch part, defined correctly on a side surface. SOLUTION: A silicon substrate 18 is arranged on a substrate electrode 12 in the working range of a sulfatron 16, connected to a resonator 20 for microwave plasma excitation inside an etching chamber 10, where the substrate electrode 12 connected to a high-frequency generator 14 is arranged. Furthermore, a polymerization process and an etching process which continue alternately are implemented, by using the microwave plasma apparatus with a waveguide 22 for drawing reactive gas. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007129260(A) 申请公布日期 2007.05.24
申请号 JP20070001632 申请日期 2007.01.09
申请人 ROBERT BOSCH GMBH 发明人 LAERMER FRANZ;SCHILP ANDREA
分类号 H01L21/302;H01L21/3065;B81C1/00;H01L21/308 主分类号 H01L21/302
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