发明名称 METHOD OF MAKING PROBE CARD
摘要 PROBLEM TO BE SOLVED: To provide a method of making a probe card provided with a sufficient height and a sufficient needle pressure capable of freely setting the layout of the probe or the number of probes. SOLUTION: The method includes a step of forming a probe unit by arranging a plurality of adjoining probes on a first substrate at prescribed intervals, and a step of arranging a prescribed number of probe units on a second substrates, so as to arrange the prescribed number of probes on the second substrate. Thereby, the probes and the first substrate are arranged vertically, and the probe and the wiring provided on the second substrate are directly connected. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007127481(A) 申请公布日期 2007.05.24
申请号 JP20050319409 申请日期 2005.11.02
申请人 JAPAN ELECTRONIC MATERIALS CORP 发明人 KIMURA TEPPEI;MACHIDA KAZUMICHI
分类号 G01R1/073 主分类号 G01R1/073
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