| 摘要 |
PROBLEM TO BE SOLVED: To provide a device testing mechanism that can form the whole pusher for pressing a device using a metal material without causing electrostatic discharge damage in the device, can speed up an increase or decrease in temperature of the whole pusher, and can stabilize the temperature of the device during measurement. SOLUTION: The testing mechanism 10 (device testing mechanism) comprises a socket 11 that can mount the device D and is connected to a testing device 7 for determining the electrical characteristic of the device D, and the pusher 12 for pressing and fixing the device D mounted to a socket 11. The pusher 12 is made of the metal material having a coated surface. COPYRIGHT: (C)2007,JPO&INPIT
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