发明名称 Semiconductor device manufacturing method and chemical fluid used for manufacturing semiconductor device
摘要 This disclosure is concerned a method of manufacturing a semiconductor device which includes providing an dielectric film on a substrate; providing a mask material on the dielectric film; etching the dielectric film using the mask material; performing a first treatment of removing a metal residue generated by etching the dielectric film; performing a second treatment of making a sidewall of the dielectric film formed by etching the dielectric film hydrophobic; and performing a third treatment of removing a silicon residue generated by etching the dielectric film.
申请公布号 US2007082491(A1) 申请公布日期 2007.04.12
申请号 US20060545515 申请日期 2006.10.11
申请人 UOZUMI YOSHIHIRO;TAKASE KAZUHIKO;MATSUMURA TSUYOSHI 发明人 UOZUMI YOSHIHIRO;TAKASE KAZUHIKO;MATSUMURA TSUYOSHI
分类号 H01L21/461;H01L21/302 主分类号 H01L21/461
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