发明名称 MEASURING METHOD AND DEVICE, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a measuring method and a measuring device capable of measuring a refractive index distribution (homogeneity) of a specimen, in particular, a higher order component of homogeneity precisely. <P>SOLUTION: In the measuring device, comprising a reference plate and a reflection plate, reflected light from the reference plate is allowed to interfere with reflected light(s) from the specimen and/or the reflection plate to measure the refractive index distribution of the specimen arranged between the reference plate and the reflection plate. The measuring device has an angle adjustment mechanism for adjusting the angle of the specimen to the light axis of the reference plate and the reflection plate. The angle adjustment mechanism passes through the specimen, and can rotatably hold the specimen with a point on a plane perpendicular to the light axis of the reference plate and the reflection plate as a rotation center. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007093498(A) 申请公布日期 2007.04.12
申请号 JP20050285850 申请日期 2005.09.30
申请人 CANON INC 发明人 SATO TAKASHI;HASHIGUCHI HIDENORI;MURAKAMI EIICHI
分类号 G01N21/45;H01L21/027 主分类号 G01N21/45
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