发明名称 LIQUID FOR REMOVING PHOTORESIST RESIDUE AND POLYMER RESIDUE
摘要 PROBLEM TO BE SOLVED: To provide a liquid composition for removing a photoresist residue and a polymer residue, with which the photoresist residue and an ashing residue remaining after dry etching and ashing are removed, in a manufacturing step of a semiconductor device having copper and a copper alloy comprising copper as a main component, and various low dielectric constant films. SOLUTION: The liquid for removing the residue remaining on a semiconductor substrate after dry etching and ashing treatment, in the manufacturing step of a semiconductor circuit element having copper and the copper alloy as a wiring material, is characterized by containing hydrofluoric acid and not containing any inorganic alkali except for an inorganic fluoride, any organic alkali, and any water-soluble organic amine. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007086689(A) 申请公布日期 2007.04.05
申请号 JP20050278654 申请日期 2005.09.26
申请人 KANTO CHEM CO INC 发明人 IKEGAMI KAORU;OWADA HIROHISA
分类号 G03F7/42;H01L21/027;H01L21/304 主分类号 G03F7/42
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