| 摘要 |
PROBLEM TO BE SOLVED: To provide a system dynamically changing a configuration of a test bench for efficiently verifying a data path when a test description for individual verification of each processing block is used for system verification in the data path made by combining a plurality of processing blocks in data path verification. SOLUTION: In this integrated circuit verification method, a common sequence basic class including a function for arranging a path model for input/output operation is defined, and a sequence class conforming thereto is defined for each processing block. In the test description, using a data path common verification function including a function for executing the path model arrangement function, the model arrangement function for each processing block is operated, and the test bench is configured. COPYRIGHT: (C)2007,JPO&INPIT
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