发明名称 Measuring device for inspecting substrate upper surface, has positioning system adjusted for positioning of head within surface of substrate, and generator coupled with opening so that head is positioned in height above substrate
摘要 <p>The device has a measuring head (210) including a sensor (211) for detection of an upper surface and a pneumatic element (212) arranged adjacent to the sensor. A planar positioning system (220) is adjusted for precise positioning of the measuring head within an x-y flat surface of the substrate. A compressed air generator (250) is pneumatically coupled with an inlet opening (215) so that the measuring head is positioned in a preset height above the substrate during an impact of the pneumatic element with compressed air.</p>
申请公布号 DE102005046154(A1) 申请公布日期 2007.03.29
申请号 DE20051046154 申请日期 2005.09.27
申请人 SIEMENS AG 发明人 DROBNER, FRANZ;ROMBAUER, THEODORO
分类号 G01B21/30;G01B13/00 主分类号 G01B21/30
代理机构 代理人
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