发明名称 MOS type semiconductor device having electrostatic discharge protection arrangement
摘要 In a semiconductor device having an electrostatic discharge protection arrangement, a semiconductor substrate exhibits a first conductivity type. First and second impurity regions each exhibiting a second conductivity type are formed in the semiconductor substrate. A channel region is formed in the semiconductor substrate between the first and second impurity regions. A first conductive area is defined on the first impurity region in the vicinity of the channel region. A second conductive area is defined on the first impurity region so as to be supplied with an electrostatic discharge current. A third conductive area is defined on the first impurity region to establish an electrical connection between the first and second conductive area. At least one heat-radiation area is defined in the third conductive area so as to be at least partially isolated therefrom and thermally contacted with the first conductive area.
申请公布号 US7196377(B2) 申请公布日期 2007.03.27
申请号 US20050111797 申请日期 2005.04.22
申请人 NEC ELECTRONICS CORPORATION 发明人 KODAMA NORIYUKI;SAWAHATA KOICHI;HIRATA MORIHISA
分类号 H01L23/62;H01L27/04;H01L21/336;H01L21/822;H01L23/60;H01L27/02;H01L27/06;H01L29/72;H01L29/73;H01L29/74;H01L29/78;H01L31/111 主分类号 H01L23/62
代理机构 代理人
主权项
地址