发明名称 PROBE CONTROL APPARATUS AND PROBE CONTROL METHOD FOR MEASURING PROBE POSITION
摘要 PROBLEM TO BE SOLVED: To provide a probe control apparats which improves a probing system in precision. SOLUTION: The probe control apparatus comprises: a probe image position detecting section which detects an image and a position of a probe 61; an image processing section which applies an image processing to a detected probe image and generates a probe geometry; and a geometry judging section which judges as to whether the generated probe geometry is normal. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007071765(A) 申请公布日期 2007.03.22
申请号 JP20050260741 申请日期 2005.09.08
申请人 TOKYO SEIMITSU CO LTD 发明人 KAMIKAYA KEN;USHIKUBO MASANOBU
分类号 G01R31/28;G01B11/00;G01R1/067;H01L21/66 主分类号 G01R31/28
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