发明名称 |
PROBE CONTROL APPARATUS AND PROBE CONTROL METHOD FOR MEASURING PROBE POSITION |
摘要 |
PROBLEM TO BE SOLVED: To provide a probe control apparats which improves a probing system in precision. SOLUTION: The probe control apparatus comprises: a probe image position detecting section which detects an image and a position of a probe 61; an image processing section which applies an image processing to a detected probe image and generates a probe geometry; and a geometry judging section which judges as to whether the generated probe geometry is normal. COPYRIGHT: (C)2007,JPO&INPIT
|
申请公布号 |
JP2007071765(A) |
申请公布日期 |
2007.03.22 |
申请号 |
JP20050260741 |
申请日期 |
2005.09.08 |
申请人 |
TOKYO SEIMITSU CO LTD |
发明人 |
KAMIKAYA KEN;USHIKUBO MASANOBU |
分类号 |
G01R31/28;G01B11/00;G01R1/067;H01L21/66 |
主分类号 |
G01R31/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|