发明名称 SOLUTION FOR IMMERSION EXPOSURE AND IMMERSION EXPOSURE METHOD
摘要 <p>The object is to resolve a fine pattern with a narrower line width/line space by immersion exposure technology in the manufacture of a semiconductor or the like. A solution for use in immersion exposure comprising a saturated hydrocarbon compound as the main ingredient, wherein the content of an impurity or impurities having an unsaturated bond or a heteroatom in its structure in the solution is as follows: (i) 2 µg/mL or less in total for a compound having a conjugated unsaturated bond; (ii) 30 µg/mL or less in total for a compound having no conjugated unsaturated bond but having a non-conjugated unsaturated bond; (iii) 15 µg/mL or less in total for an amine having no unsaturated bond; and (iv) 100 µg/mL or less in total for a heterocyclic compound, an alcohol, an ether and a haloganated compound other than the compound defined in any one of (i) to (iii).</p>
申请公布号 WO2007026573(A1) 申请公布日期 2007.03.08
申请号 WO2006JP316432 申请日期 2006.08.22
申请人 MITSUI CHEMICALS, INC.;KAGAYAMA, AKIFUMI;NAKAYAMA, NORIO;TAMATANI, HIROAKI 发明人 KAGAYAMA, AKIFUMI;NAKAYAMA, NORIO;TAMATANI, HIROAKI
分类号 G03F7/20;H01L21/027 主分类号 G03F7/20
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