<p>There is described a Raman spectroscopy system (1) for detecting Raman active analytes located at a conducting surface (11) in a sample (3). The system (1) comprises a pump laser (2) for irradiating the sample (3) with laser light having a frequency substantially tuned to a plasmon resonance band of the conducting surface (11) and also substantially tuned to an electronic absorption band of the analytes to generate an enhanced Raman scattering signal. In addition, the system (1) comprises a probe laser (4) for irradiating the sample with laser light having a frequency substantially tuned to a frequency of the enhanced Raman scattering signal to stimulate the enhanced Raman scattering signal yet further.</p>
