发明名称 DIAGNOSTIC METHOD FOR I/O DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a diagnosis execution method by which the performance of an I/O device is not deteriorated when executing a program for diagnosing the I/O device under execution of an application. <P>SOLUTION: For a certain period, information showing the use state of I/O devices 5, 6 as diagnosis objects before execution of diagnosis of the I/O devices 5, 6 and information showing the processor use state of an application process executed in a system are collected. Then, a diagnostic program collects information about the current degree of use of a processor regarding a process in which the degree of use of the I/O device is highly correlated with the degree of use of a processor of the process in terms of timing, and determines whether or not the I/O devices can be diagnosed, respectively according to whether or not the collected degree of use of the processor exceed a predetermined threshold. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007034864(A) 申请公布日期 2007.02.08
申请号 JP20050219839 申请日期 2005.07.29
申请人 HITACHI LTD 发明人 ITO MASANAO
分类号 G06F11/34;G06F11/22;G06F13/00 主分类号 G06F11/34
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