发明名称 Mechanism to stabilize power delivered to a device under test
摘要 According to one embodiment a system is disclosed. The system includes a tester having a power supply, an integrated circuit device under test (DUT) and a transient compressor (TC) coupled between the tester and the power supply to stabilize power delivered to the DUT by injecting current into the path between the power supply and the DUT.
申请公布号 US7173446(B2) 申请公布日期 2007.02.06
申请号 US20040875874 申请日期 2004.06.24
申请人 INTEL CORPORATION 发明人 ISAKHAROV ARTHUR R.;CHANG ISAAC;CHAI AI SSA;SWETTLEN TIMOTHY M.
分类号 G01R31/26;G01R31/28;G01R31/319 主分类号 G01R31/26
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