发明名称 |
A WAFER TRANSFER DEVICE OF WAFER ETCHING EQUIPMENT |
摘要 |
A wafer transfer device of wafer etching equipment is provided to clean contaminants including particles on a surface of a wafer by using a nitrogen gas nozzle. A transfer arm unit(11) is used for mapping each wafer slot and detecting a wafer notch in order to be moved to the detected wafer notch. A chuck unit(21) holds and fixes a backside of a wafer in a state of lift chuck vacuum by using venturi vacuum in order to fix the wafer. A gas nozzle unit(23) is installed at the chuck unit. The gas nozzle unit discharges gas to clean a surface of the wafer while the chuck unit is in the state of lift chuck vacuum. The gas is composed of N2 gas.
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申请公布号 |
KR100673010(B1) |
申请公布日期 |
2007.01.24 |
申请号 |
KR20050076225 |
申请日期 |
2005.08.19 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
HWANG, HYUN JU |
分类号 |
H01L21/68;B65G47/91 |
主分类号 |
H01L21/68 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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