发明名称 METHOD FOR FABRICATING CAPACITOR IN SEMICONDUCTOR DEVICE
摘要 A method of manufacturing a capacitor of a semiconductor device is provided to reduce an incubation cycle of an Ru storage node and to improve step coverage characteristics of the Ru storage node by performing a metal source flushing process on an insulating layer. An insulating layer(35) is formed on a semiconductor substrate(31). A metal source flushing process is performed on the insulating layer, so that the insulating layer is capable of adsorbing easily a metallic material. A metallic storage node is formed on the insulating layer. A dielectric film and a plate node electrode are sequentially formed on the metallic storage node. The flushing process is performed on the insulating layer for 1 to 500 second.
申请公布号 KR100672766(B1) 申请公布日期 2007.01.22
申请号 KR20050130441 申请日期 2005.12.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YEOM, SEUNG JIN;KIL, DEOK SIN;KIM, JIN HYOCK;PARK, KI SEON;SONG, HAN SANG;ROH, JAE SUNG
分类号 H01L21/8242;H01L27/108 主分类号 H01L21/8242
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