发明名称 SOURCE SIDE INJECTION STORAGE DEVICE WITH SPACER GATES AND METHOD THEREFOR
摘要 <p>A storage device structure (10) has two bits of storage per control gate (34) and uses source side injection (SSI) to provide lower programming current. A control gate (34) overlies a drain electrode formed by a doped region (22) that is positioned in a semiconductor substrate (12). Two select gates (49 and 50) are implemented with conductive sidewall spacers adjacent to and lateral to the control gate (34). A source doped region (60) is positioned in the semiconductor substrate (12) adjacent to one of the select gates for providing a source of electrons to be injected into a storage layer (42) underlying the control gate. Lower programming results from the SSI method of programming and a compact memory cell size exists.</p>
申请公布号 WO2007005191(A1) 申请公布日期 2007.01.11
申请号 WO2006US22281 申请日期 2006.06.08
申请人 FREESCALE SEMICONDUCTOR;HONG, CHEONG, M;CHINDALORE, GOWRISHANKAR, L 发明人 HONG, CHEONG, M;CHINDALORE, GOWRISHANKAR, L
分类号 H01L21/336;H01L29/788 主分类号 H01L21/336
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