发明名称 METHOD AND APPARATUS FOR FORMING OXYNITRIDE FILM AND NITRIDE FILM, OXYNITRIDE FILM, NITRIDE FILM AND BASE MATERIAL
摘要 Uniform nitride film and oxynitride film are formed by low-temperature and high-speed nitriding, not dependent on nitriding time and nitriding temperature of nitriding reaction. A solid dielectric is arranged on at least one opposing plane of a pair of counter electrodes under a pressure of 300 (Torr) or more. A nitrogen gas including an oxide of 0.2% or less is introduced between the pair of counter electrodes so as to apply a magnetic field, and N2 (2nd p.s.) or N2 (H.I.R.) activated species plasma is obtained. The plasma is brought into contact with an object to be processed and the nitride film/oxynitride film is formed on the surface of the object to be processed. ® KIPO & WIPO 2007
申请公布号 KR20070004881(A) 申请公布日期 2007.01.09
申请号 KR20067021936 申请日期 2006.10.23
申请人 SEKISUI CHEMICAL CO., LTD. 发明人 FUJIMURA NORIFUMI;HAYAKAWA RYOMA;KITAHATA HIROYA;UEHARA TSUYOSHI;YARA TAKUYA
分类号 H01L21/318;C23C8/24;C23C8/28;C23C8/36;H01J37/32;H01L21/205;H01L21/31;H01L21/314 主分类号 H01L21/318
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