发明名称 |
METHOD AND APPARATUS FOR FORMING OXYNITRIDE FILM AND NITRIDE FILM, OXYNITRIDE FILM, NITRIDE FILM AND BASE MATERIAL |
摘要 |
Uniform nitride film and oxynitride film are formed by low-temperature and high-speed nitriding, not dependent on nitriding time and nitriding temperature of nitriding reaction. A solid dielectric is arranged on at least one opposing plane of a pair of counter electrodes under a pressure of 300 (Torr) or more. A nitrogen gas including an oxide of 0.2% or less is introduced between the pair of counter electrodes so as to apply a magnetic field, and N2 (2nd p.s.) or N2 (H.I.R.) activated species plasma is obtained. The plasma is brought into contact with an object to be processed and the nitride film/oxynitride film is formed on the surface of the object to be processed. ® KIPO & WIPO 2007
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申请公布号 |
KR20070004881(A) |
申请公布日期 |
2007.01.09 |
申请号 |
KR20067021936 |
申请日期 |
2006.10.23 |
申请人 |
SEKISUI CHEMICAL CO., LTD. |
发明人 |
FUJIMURA NORIFUMI;HAYAKAWA RYOMA;KITAHATA HIROYA;UEHARA TSUYOSHI;YARA TAKUYA |
分类号 |
H01L21/318;C23C8/24;C23C8/28;C23C8/36;H01J37/32;H01L21/205;H01L21/31;H01L21/314 |
主分类号 |
H01L21/318 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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