发明名称 Low temperature method for fabricating high-aspect ratio vias and devices fabricated by said method
摘要 Embodiments of the present invention are directed to a process for forming small diameter vias at low temperatures. In preferred embodiments, through-substrate vias are fabricated by forming a through-substrate via; and depositing conductive material into the via by means of a flowing solution plating technique, wherein the conductive material releases a gas that pushes the conductive material through the via to facilitate plating the via with the conductive material. In preferred embodiments, the fabrication of the substrate is conducted at low temperatures.
申请公布号 US2006292866(A1) 申请公布日期 2006.12.28
申请号 US20050167014 申请日期 2005.06.23
申请人 BORWICK ROBERT L;STUPAR PHILIP A;DENATALE JEFFREY F;TSAI CHAILUN;YAO ZHIMIN J;GARRETT KATHLEEN;WHITE JOHN;WARREN LES;TENCH MORGAN 发明人 BORWICK ROBERT L.;STUPAR PHILIP A.;DENATALE JEFFREY F.;TSAI CHAILUN;YAO ZHIMIN J.;GARRETT KATHLEEN;WHITE JOHN;WARREN LES;TENCH MORGAN
分类号 H01L21/76;H01L21/44 主分类号 H01L21/76
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