| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide structures and methods for emulation, simulation and tests, capable of shortening development time with superior observability, testability and controllability without having to use an expensive tester for testing or debugging a large-scale integrated circuit. <P>SOLUTION: The emulation device 11 distributes common control information 8801 to each of a plurality of clock domains 1213, 1215 and 1217 into which the emulation device is partitioned, and also provides the clock domains with individualized clock control 8905, 8907 and 8913. <P>COPYRIGHT: (C)2007,JPO&INPIT |
