发明名称 EQUIPMENT FOR NON-CONTACT TEMPERATURE MEASUREMENT OF SAMPLES OF MATERIALS ARRANGED UNDER VACUUM
摘要 The invention concerns an equipment for non-contact temperature measurement (1) of samples of materials (2) arranged in a vacuum chamber (12). A UV lamp (6) illuminates the samples (2) through a window (4), so as to subject them to a predetermined thermal cycle and to perform an environmental test, in particular for materials designed for space missions. An external pyrometer measures the temperature of the samples (2) through a window (6). It is associated with a scanning module (9) including a mobile mirror, with two axes of rotation and three orthogonal axes of translation, arranged on the optical path of the infrared radiation (Rir) so as to obtain a two-dimensional scanning of each sample (2) by means of a measuring spot focused on the surface of the samples. In a preferred embodiment, the samples are of slight thickness and locked pressed against a convex support. The whole assembly is monitored by an automatic data processing system with recorded programme (10).
申请公布号 WO2006131656(A2) 申请公布日期 2006.12.14
申请号 WO2006FR01305 申请日期 2006.06.07
申请人 ORGANISATION INTERGOUVERNEMENTALE DITE AGENCE SPATIALE EUROPEENNE;SEMPRIMOSCHNIG, CHRISTOPH;VAN EESBEEK, MARC, R., J.;HELTZEL, STAN 发明人 SEMPRIMOSCHNIG, CHRISTOPH;VAN EESBEEK, MARC, R., J.;HELTZEL, STAN
分类号 G01N25/72;G01J5/04 主分类号 G01N25/72
代理机构 代理人
主权项
地址