发明名称 SEMICONDUCTOR DEVICE AND RANDOM ACCESS MEMORY HAVING A SINGLE GATE ELECTRODE CORRESPONDING A PAIR OF FIN-TYPE CHANNEL REGIONS
摘要 A semiconductor device and a random access memory having a single gate electrode corresponding to a pair of fin-type channel regions are provided to increase operational current and operational speed by using a pair of channel regions as conductive paths of charges. A semiconductor substrate(110) includes a body(102) and a pair of pins(105a,105b) projected from the body. A source and a drain are formed at the pair of pins, respectively. A pair of channel regions are formed at inner surfaces of the pair of pins between the source and the drain. A gate electrode(130) includes a burial part for burying a gap between the pair of channel regions. The gate electrode is isolated from the semiconductor substrate. A source contact plug(135) is electrically connected with the source of the pair of pins and is isolated from the body. A drain contact plug(140) is electrically connected with the drain of the pair of pins and is isolated from the body.
申请公布号 KR100657964(B1) 申请公布日期 2006.12.08
申请号 KR20050066989 申请日期 2005.07.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, WON JOO;KIM, SUK PIL;PARK, YOON DONG;LEE, EUN HONG;HYUN, JAE WOONG;LEE, JUNG HOON;BYUN, SUNG JAE
分类号 H01L21/336;H01L21/8242;H01L27/108 主分类号 H01L21/336
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