发明名称 High density trench MOSFET with low gate resistance and reduced source contact space
摘要 A trenched metal oxide semiconductor field effect transistor (MOSFET) device that includes gate contact trenches and source contact trenches opened through oxide insulation layers into the gate polysilicon and the body-source silicon regions. The gate contact trenches and the source contact trenches are filled with gate contact plug and source contact plug for electrically contacting the gate poly and the source-body regions such that the gate resistance is reduced and narrower source contact areas are achieved.
申请公布号 US2006273382(A1) 申请公布日期 2006.12.07
申请号 US20050204860 申请日期 2005.08.15
申请人 M-MOS SDN. BHD. 发明人 HSHIEH FWU-IUAN
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
代理机构 代理人
主权项
地址