发明名称 METHOD OF MEASURING DEAD TIME IN X-RAY DETECTOR
摘要 PROBLEM TO BE SOLVED: To precisely measure a dead time in a pulse type X-ray detector in a very short time, without estimating a true X-ray intensity. SOLUTION: The first condition and the second condition are used to change an incident X-ray intensity of the X-ray detector 14. At least three kinds of slit widths are selectable in the slit width W of a photoreception slit 20, in the first condition. An absorption plate 18 is present or absent in the second condition. The first record X-ray intensity is recorded at least the three kinds of slit widths W under the condition where the absorption plate 18 is inserted. Then, the second record X-ray intensity is recorded by the same manner under the condition where the absorption plate 18 is removed. A prescribed relational expression is satisfied among the first record X-ray intensity, the second record X-ray intensity, a ratio k of the first record X-ray intensity to the second record X-ray intensity (based on attenuation of the X-ray intensity by the absorption plate 18), and the dead timeτin the X-ray detector, and the dead timeτis precisely determined with fitting by a method of least square, based on the relational expression. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006322885(A) 申请公布日期 2006.11.30
申请号 JP20050148039 申请日期 2005.05.20
申请人 RIGAKU CORP 发明人 UEDA TOMOYASU;ITO YOSHIYASU;OMOTE KAZUHIKO
分类号 G01T7/00;G01T1/17 主分类号 G01T7/00
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