| 摘要 |
A pattern generator and a test apparatus are provided to efficiently generate a test pattern and to efficiently test electronic devices by improving the structure thereof. A pattern generator includes a cache memory, a main memory(60), and an instruction memory(114). The main memory is for storing a number of test data blocks. Each of the test data blocks is test data which are stored in the cache memory. The instruction memory is for storing instruction information indicating the orders of test data blocks to be stored in the cache memory. The pattern generator outputs in sequence the test data blocks stored in the cache memory as a test pattern.
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