| 发明名称 |
METHOD FOR INSPECTING ARRAY BOARD AND METHOD FOR MANUFACTURING ARRAY BOARD |
| 摘要 |
In the case of inspecting an array board, whether a defect exists in the array board is inspected prior to providing a pixel electrode (step (S3)), and after providing the pixel electrode (step (S7)).
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| 申请公布号 |
KR20060118595(A) |
申请公布日期 |
2006.11.23 |
| 申请号 |
KR20067017004 |
申请日期 |
2006.08.24 |
| 申请人 |
TOSHIBA MATSUSHITA DISPLAY TECHNOLOGY CO., LTD. |
发明人 |
TOMITA SATORU |
| 分类号 |
G01R31/00;G02F1/13;G02F1/1362 |
主分类号 |
G01R31/00 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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