发明名称 CONDUCTION TESTER FOR WIRE HARNESS
摘要 <p>A conduction tester (10) where a contact probe (182) is placed so as to project forward from the front face of an inspection section body (181) and where both sidewalls for protecting the inside of the conduction tester (10) are constructed from transparent side plates (14, 15), thereby visual inspection from the outside is facilitated. The inspection section body (181) is removably attached to a slide body (17), so that an inspection section (18) can be easily replaced and repaired when the contact probe (182) is bent to cause electrical short-circuiting and disconnection inside the inspection section (18) etc.</p>
申请公布号 WO2006117988(A1) 申请公布日期 2006.11.09
申请号 WO2006JP307760 申请日期 2006.04.12
申请人 SUMITOMO WIRING SYSTEMS, LTD.;SHIRAKAWA, JUN-ICHI;FUKADA, KAZUMITSU 发明人 SHIRAKAWA, JUN-ICHI;FUKADA, KAZUMITSU
分类号 H01R43/00;G01R31/02 主分类号 H01R43/00
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