发明名称 |
CONDUCTION TESTER FOR WIRE HARNESS |
摘要 |
<p>A conduction tester (10) where a contact probe (182) is placed so as to project forward from the front face of an inspection section body (181) and where both sidewalls for protecting the inside of the conduction tester (10) are constructed from transparent side plates (14, 15), thereby visual inspection from the outside is facilitated. The inspection section body (181) is removably attached to a slide body (17), so that an inspection section (18) can be easily replaced and repaired when the contact probe (182) is bent to cause electrical short-circuiting and disconnection inside the inspection section (18) etc.</p> |
申请公布号 |
WO2006117988(A1) |
申请公布日期 |
2006.11.09 |
申请号 |
WO2006JP307760 |
申请日期 |
2006.04.12 |
申请人 |
SUMITOMO WIRING SYSTEMS, LTD.;SHIRAKAWA, JUN-ICHI;FUKADA, KAZUMITSU |
发明人 |
SHIRAKAWA, JUN-ICHI;FUKADA, KAZUMITSU |
分类号 |
H01R43/00;G01R31/02 |
主分类号 |
H01R43/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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