发明名称 |
ERASE DISCHARGE METHOD OF MEMORY DEVICE |
摘要 |
An erase voltage discharge method of a memory device is provided to determine erase time by determining the time of starting a second discharge after a first discharge according to a CSL voltage during an erase operation of a memory cell. According to an erase voltage discharge method of a semiconductor memory device, a CSL(Common Source Line) of the semiconductor memory device is discharged first. The voltage of the CSL is detected during the first discharge. The detected CLS voltage is compared with a reference voltage. The CSL is discharged secondly, if the detected CLS voltage is lower than the reference voltage.
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申请公布号 |
KR20060115129(A) |
申请公布日期 |
2006.11.08 |
申请号 |
KR20050037475 |
申请日期 |
2005.05.04 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, JIN WOOK;LEE, JIN YUB |
分类号 |
G11C16/14 |
主分类号 |
G11C16/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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