发明名称 ERASE DISCHARGE METHOD OF MEMORY DEVICE
摘要 An erase voltage discharge method of a memory device is provided to determine erase time by determining the time of starting a second discharge after a first discharge according to a CSL voltage during an erase operation of a memory cell. According to an erase voltage discharge method of a semiconductor memory device, a CSL(Common Source Line) of the semiconductor memory device is discharged first. The voltage of the CSL is detected during the first discharge. The detected CLS voltage is compared with a reference voltage. The CSL is discharged secondly, if the detected CLS voltage is lower than the reference voltage.
申请公布号 KR20060115129(A) 申请公布日期 2006.11.08
申请号 KR20050037475 申请日期 2005.05.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JIN WOOK;LEE, JIN YUB
分类号 G11C16/14 主分类号 G11C16/14
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