发明名称 FUSE DETECTION METHOD AND SEMICONDUCTOR STORAGE DEVICE HAVING FUSE DETECTION CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a simple fuse detection method practiced in online mass production, and a semiconductor device having a fuse detection circuit. SOLUTION: Program states of fuses are read, then the number of programmed fuses is counted and compared with an expected value, thereby the number of programmed fuses and whether it agrees with the expected value are detected. By using such a configuration, a fuse detection method and a semiconductor device having a fuse detection circuit are obtained. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006294096(A) 申请公布日期 2006.10.26
申请号 JP20050110936 申请日期 2005.04.07
申请人 ELPIDA MEMORY INC 发明人 TANAKA SO;KAWAMATA YOSUKE
分类号 G11C29/04 主分类号 G11C29/04
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