发明名称 |
Method of accelerated testing of illuminated device components |
摘要 |
Methods and devices for accelerated light stability testing are described. The method comprises exposing a component to light having a total irradiance at wavelengths between 300 nm and 500 nm wherein the irradiance at wavelengths ranging from 300 nm to 350 nm is less than 3.1% of the total irradiance; the irradiance at wavelengths ranging from greater than 350 nm to 380 nm ranges from 0.2% to 2.2% of the total irradiance; the irradiance at wavelengths ranging from greater than 380 nm to 420 nm ranges from 4.5% to 9.1% of the total irradiance; and the irradiance at wavelength ranging from greater than 420 nm to 500 nm ranges from about 86% to about 95% of the total irradiance.
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申请公布号 |
US7124651(B2) |
申请公布日期 |
2006.10.24 |
申请号 |
US20040914386 |
申请日期 |
2004.08.09 |
申请人 |
3M INNOVATIVE PROPERTIES COMPANY |
发明人 |
KETOLA WARREN D.;FISCHER, JR. RICHARD M. |
分类号 |
G01N17/00;G01N21/88;H01J9/42 |
主分类号 |
G01N17/00 |
代理机构 |
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