发明名称 WAFER PLATING APPARATUS FOR IMPROVING PROCESS UNIFORMITY
摘要 Disclosed is a wafer electroplating apparatus, which includes an electroplating bath comprising an anode in the electroplating bath, an electroplating solution, and a cathode located on the top of the electroplating bath and on to which a wafer is mounted. The cathode comprises a first portion electrically connected to an edge of the wafer, and a second portion extending from the first portion and electrically connected to a side of the wafer. The direct contact of the cathode with the side and front edges of the wafer ensures uniform distribution of the electrical field on the wafer during the electroplating process. Consequently, a uniform thickness of metal film deposition is achieved.
申请公布号 KR100634446(B1) 申请公布日期 2006.10.16
申请号 KR20040115407 申请日期 2004.12.29
申请人 发明人
分类号 H01L21/288 主分类号 H01L21/288
代理机构 代理人
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