发明名称 P-channel charge trapping memory device with sub-gate
摘要 A semiconductor device includes a semiconductor substrate. The semiconductor substrate includes a first inversion region, a second inversion region, and a channel region between the first inversion region and the second inversion region. The semiconductor device further includes a control gate over the channel region and at least one sub-gate over the first and second inversion regions, wherein the control gate does not extend over the at least one sub-gate.
申请公布号 US2006226467(A1) 申请公布日期 2006.10.12
申请号 US20050100518 申请日期 2005.04.07
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 LUE HANG-TING;WU MIN-TA;LAI ERH-KUN;SHIH YEN-HAO;HO CHIA-HUA;HSIEH KUANG-YEU
分类号 H01L29/788 主分类号 H01L29/788
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