发明名称 Method of manufacturing semiconductor device
摘要 A method of manufacturing a semiconductor device, includes the steps of: raising a temperature of a sapphire substrate which is included in the semiconductor device from a room temperature to a preheat temperature of 150° C. to 450° C. and keeping the preheat temperature for a first predetermined time, thereby preheating the semiconductor device; and subsequently raising a temperature of the sapphire substrate from the preheat temperature to a thermal reaction temperature of 500° C. or higher and keeping the thermal reaction temperature for a second predetermined time, thereby performing a thermal reaction treatment of the semiconductor device.
申请公布号 US2006211225(A1) 申请公布日期 2006.09.21
申请号 US20060370891 申请日期 2006.03.09
申请人 KAGEYAMA MAKIKO 发明人 KAGEYAMA MAKIKO
分类号 H01L21/205;H01L21/265;H01L27/12 主分类号 H01L21/205
代理机构 代理人
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