发明名称 DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a defect detection device capable of easy and accurate defect detection when a plurality kinds of surface states of an inspection object to be determined to be a nondefective article exist. <P>SOLUTION: In this defect detection device for detecting a defect of the inspection object by processing image information of the inspection object acquired by imaging the surface state of the inspection object which is an object to be inspected, a mode determination means 103 determines to which surface mode the inspection object is pertinent by comparing inspection frequency information determined by subjecting image information acquired by imaging the inspection object to frequency conversion with standard frequency information in each surface mode stored in a standard frequency information storage means, and a defective image generation means 104 generates a defective image by subjecting to reverse frequency conversion, a frequency component extracted by taking a difference between the inspection frequency information and the standard frequency information corresponding to the surface mode determined by the mode determination means, and a defect determination means 105 determines existence of a defect of the inspection object by the defective image. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006234656(A) 申请公布日期 2006.09.07
申请号 JP20050051155 申请日期 2005.02.25
申请人 RICOH CO LTD 发明人 NAKAYAMA OSAMU
分类号 G01N21/88;G01B11/30;G06T1/00;G06T7/00 主分类号 G01N21/88
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