发明名称 Enhanced anti-parallel-pinned sensor using thin ruthenium spacer and high magnetic field annealing
摘要 An anti-parallel pinned sensor is provided with a spacer that increases the anti-parallel coupling strength of the sensor. The anti-parallel pinned sensor is a GMR or TMR sensor having a pure ruthenium or ruthenium alloy spacer. The thickness of the spacer is less than 0.8 nm, preferably between 0.1 and 0.6 nm. The spacer is also annealed in a magnetic field that is 1.5 Tesla or higher, and preferably greater than 5 Tesla. This design yields unexpected results by more than tripling the pinning field over that of typical AP-pinned GMR and TMR sensors that utilize ruthenium spacers which are 0.8 nm thick and annealed in a relatively low magnetic field of approximately 1.3 Tesla.
申请公布号 SG124377(A1) 申请公布日期 2006.08.30
申请号 SG20060000376 申请日期 2006.01.19
申请人 HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V. 发明人 LEE WEN-YAUNG;LI JINSHAN;MAURI DANIELE;NISHIOKA KOICHI;TAJIMA YASUNARI
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