发明名称 BONDING WIRE FOR SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a copper bonding wire for a semiconductor device the materials cost of which is inexpensive and excellent in bonding properties, loop controllability, wire deformation, etc. , for a semiconductor with a large diameter for use in a power IC, a semiconductor for which a low cost is top priority, etc. <P>SOLUTION: The bonding wire for a semiconductor device has a core material composed mainly of copper, and a skin layer of conductive metal the composition of which is different from that of the core material and characterized by having a gradient of concentration of copper in the direction of the wire diameter in the skin layer. The concentration of copper is 0.1 mol% or more on the surface of the skin layer. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006216929(A) 申请公布日期 2006.08.17
申请号 JP20050193629 申请日期 2005.07.01
申请人 NIPPON STEEL CORP 发明人 UNO TOMOHIRO;YAMAMOTO YUKIHIRO
分类号 H01L21/60 主分类号 H01L21/60
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