| 摘要 |
A semiconductor device controls an error of the AC parameter caused by a processing variation without reproduction of the semiconductor device, thereby reducing the new design and developing time. The semiconductor device includes an antifuse unit having a plurality of programmable antifuses and producing digital coding signals by programming the antifuses in a test mode. The semiconductor device also includes a timing adjustor for adjusting an output time of an input signal by using the digital coding signals. The timing adjustor includes a plurality of capacitors for producing different delay times of the input signal, and a latch circuit for latching a delayed input signal in response to a data strobe signal.
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