发明名称 |
Semiconductor device and fabricating method thereof |
摘要 |
The present invention provides a semiconductor device in which occurrence of disclination caused by steps in a contact portion and steps between pixel electrodes is prevented. A method of fabricating a semiconductor device according to the invention includes forming an insulating film 2 on an electrode 1 a so as to cover the electrode; forming contact holes 2 a and 2 b located on the electrode and concave portions 2 c and 2 d connected to the contact hole; embedding a conductive film 8 in the contact hole and the concave portion and forming a conductive film 8 on the insulating film; and applying the CMP polishing or the etching-back to the conductive film, and thereby forming a pixel electrode made of the conductive films 8 a and 8 b embedded in the contact hole and the concave portion.
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申请公布号 |
US7084503(B2) |
申请公布日期 |
2006.08.01 |
申请号 |
US20030697987 |
申请日期 |
2003.10.31 |
申请人 |
SHARP KABUSHIKI KAISHA |
发明人 |
ISHIKAWA AKIRA;EGUCHI SHINGO;ODA SEIJI;HIGAMI YOSHINORI |
分类号 |
G02F1/1368;H01L23/48;G02F1/1343;H01L21/00;H01L21/3205;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/417;H01L29/45;H01L29/786 |
主分类号 |
G02F1/1368 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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