发明名称 A NON-VOLATILE MEMORY CELL COMPRISING A DIELECTRIC LAYER AND A PHASE CHANGE MATERIAL IN SERIES
摘要 <p>The invention provides for a nonvolatile memory cell comprising a dielectric material in series with a phase change material, such as a chalcogenide. Phase change is achieved in chalcogenide memories by thermal means. Concentrating thermal energy in a relatively small volume assists this phase change. By applying high voltage across a dielectric layer, dielectric breakdown occurs, forming a low-resistance rupture region traversing the dielectric layer. This rupture region can serve to concentrate thermal energy in a phase-change memory cell. In a preferred embodiment, such a cell can be used in a monolithic three dimensional memory array.</p>
申请公布号 WO2006078505(A2) 申请公布日期 2006.07.27
申请号 WO2006US00774 申请日期 2006.01.11
申请人 MATRIX SEMICONDUCTOR, INC.;SCHEUERLEIN, ROY E.;HERNER, S. BRAD 发明人 HERNER, S. BRAD
分类号 H01L21/336;G11C7/00;G11C11/39;G11C17/16;H01L21/82;H01L27/24;H01L29/73;H01L45/00 主分类号 H01L21/336
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