发明名称 INSPECTION DEVICE AND PTP PACKER
摘要 <P>PROBLEM TO BE SOLVED: To provide an inspection device which at least enables proper inspection on a chip on a tablet surface in inspecting tablets for defectiveness/nondefectiveness in a PTP sheet manufacturing process, and a PTP packer. <P>SOLUTION: Images of tablets are captured through transmitted light that is emitted from a lighting device to pass through the tablets. Image data output from a camera is digitized (S200), and connected elements are labeled based on the digitized image data (S210) to obtain brightness connected elements corresponding to the bright side and dark connected elements corresponding to the low-brightness side (S220). Each connected element is sorted with regard to an area value in decreasing order (S230). A sequence of reference area values per connected elements at least including reference values for chips is prepared. The reference area value sequence sorted in decreasing order beforehand is compared to the above connected element area values to judge on the defectiveness/nondefectiveness of the tablets (S240 to S 280). <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006193197(A) 申请公布日期 2006.07.27
申请号 JP20050008721 申请日期 2005.01.17
申请人 CKD CORP 发明人 TAGUCHI YUKIHIRO;ISHIGURE KATSUNORI;OYAMA TAKESHI
分类号 B65B57/10;B65B9/04 主分类号 B65B57/10
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