| 摘要 |
Methods and apparatus are provided for projecting the useful life Y<SUB>proj </SUB>of an ultracapacitor undergoing at least one ON period after an OFF period. The apparatus comprises sensors coupled to the ultracapacitor for measuring the instantaneous voltage V(t) and temperature T(t) thereof as a function of time t, and a measuring system coupled to the sensors, the measuring system receiving V(t), T(t) and computing Y<SUB>proj </SUB>based at least in part on combining values of the instantaneous ultracapacitor life Y(V(t),T(t))=10<SUP>(aT+bV+c) </SUP>where a, b and c are constants, for different values of t. The measuring system preferably includes program, temporary and non-volitile memory, a processor, a timer and an I/O for communicating with the sensors and other vehicle systems. In a preferred embodiment, values of V(t), T(t) at the beginning and end of the OFF period are also used in determining Y<SUB>proj</SUB>.
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