发明名称 Solid-state imaging device and radiotion imaging system
摘要 N<SUP>+</SUP>-type semiconductor regions 12 d are formed on a front surface side of a p<SUP>31 </SUP>-type layer 12 c of a semiconductor substrate 12 , and these n<SUP>+</SUP>-type semiconductor and p<SUP>-</SUP>-type semiconductor constitute photodiodes. A metal wire 14 electrically connected to an isolation region 12 e is formed on a first insulating layer 13 . The metal wire 14 is provided so that its edge covers pn junction portions (interfaces between p<SUP>-</SUP>-type layer 12 c and n<SUP>+</SUP>-type semiconductor regions 12 d) exposed on a light-incident surface of the semiconductor substrate 12 (p<SUP>-</SUP>-type layer 12 c), above the pn junction portions, and is of grid shape. The metal wire 14 is grounded and the isolation region 12 e is set at the ground potential.
申请公布号 US2006145084(A1) 申请公布日期 2006.07.06
申请号 US20050536904 申请日期 2005.11.18
申请人 HAMAMATSU PHOTONICS K.K. 发明人 MORI HARUMICHI;FUJITA KAZUKI;KYUSHIMA RYUJI;HONDA MASAHIKO
分类号 G01T1/20;H01L27/146;G01T1/24;H01L27/14;H01L31/09;H01L31/10;H04N5/32;H04N5/335;H04N5/357;H04N5/369;H04N5/374 主分类号 G01T1/20
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