发明名称 Test method and test apparatus for digital-analog converter
摘要 A cyclic pattern data is input into a digital-analog (DA) converter that converts predetermined digital data into analog data. The cyclic pattern data has a symmetrical waveform when output from the DA converter. Even-numbered high harmonic components 2f<SUB>0</SUB>, 4f<SUB>0 </SUB>with respect to a fundamental frequency f<SUB>0 </SUB>of the cyclic pattern data are observed. When there are no even-numbered high harmonic components 2f<SUB>0</SUB>, 4f<SUB>0</SUB>, the DA converter is determined to operate well.
申请公布号 US2006116834(A1) 申请公布日期 2006.06.01
申请号 US20050045493 申请日期 2005.01.31
申请人 ADVANTEST CORPORATION 发明人 ORISAKA SHIGEKI
分类号 G01R23/00 主分类号 G01R23/00
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