发明名称 SCALABLE INTEGRATED LOGIC AND NON-VOLATILE MEMORY
摘要 <p>A scalable, logic transistor has a pair of doped regions for the drain and source. A gate insulator layer is formed over the substrate and between the drain and source regions. A gate stack is formed of a gate layer, such as polysilicon or metal, between two metal nitride layers. A compatible non-volatile memory transistor can be formed from this basic structure by adding a high-K dielectric constant film with an embedded metal nano-dot layer between the tunnel insulator and the gate stack.</p>
申请公布号 WO2006057773(A1) 申请公布日期 2006.06.01
申请号 WO2005US39391 申请日期 2005.11.01
申请人 MICRON TECHNOLOGY, INC.;BHATTACHARYYA, ARUP 发明人 BHATTACHARYYA, ARUP
分类号 H01L29/423;H01L21/28;H01L21/336 主分类号 H01L29/423
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