发明名称 SYSTEM AND METHOD FOR ANALYZING PHOTOMASK GEOMETRIES
摘要 After simulated geometry (106) has been generated, simulated geometry (106) may be modified to generate a predicted resulting geometry (108). Predicted resulting geometry (108) includes a predication of the geometry that would be formed in patterned layer (58) of photomask (52) if photomask (52) were processed using modified geometry (102) as input for imaging<sup
申请公布号 WO2006041868(A1) 申请公布日期 2006.04.20
申请号 WO2005US35737 申请日期 2005.10.05
申请人 TOPPAN PHOTOMASKS, INC.;NAKAGAWA, KENT;BUCK, PETER 发明人 NAKAGAWA, KENT;BUCK, PETER
分类号 G03F1/00;G03F1/36 主分类号 G03F1/00
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