发明名称 Program, test apparatus and testing method
摘要 A recording medium, on which a program is recorded to operate a testing apparatus for testing an electronic device, is provided, wherein the program makes the testing apparatus perform functions as a comparing unit for comparing the output signal from the electronic device with an expected value signal to be applied, a timing generating unit for generating a rate signal and providing the comparing unit with the rate signal, wherein the rate signal determines timing at which the comparing unit compares the output signal with the expected value signal, a fail memory for saving the comparison results obtained by comparing the output signal with the expected value signal successively according to the rate signal to different addresses successively, and a period calculating unit for calculating the period of the output signal based on the comparison results stored successively in the fail memory, in case of executing a test for measuring the period of the output signal.
申请公布号 US2006085712(A1) 申请公布日期 2006.04.20
申请号 US20040954727 申请日期 2004.09.30
申请人 ADVANTEST CORPORATION 发明人 FURUMI SHINJI
分类号 G01R31/28 主分类号 G01R31/28
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