发明名称 |
PLATE TYPE SUBSTRATE FOR USING TO FORM SEMICONDUCTOR ELEMENT AND ITS MANUFACTURING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To obtain both of the reduction of warpage of a plate type substrate and the improvement of crystallinity in a main semiconductor region. <P>SOLUTION: The main semiconductor region for forming the principal part of a semiconductor element is arranged on a silicon substrate through a buffer region 3 constituted of a nitride semiconductor. The buffer region 3 is formed of the alternative laminate of a plurality of first buffer regions 9 of a multilayered structure, and a plurality of second buffer regions 10 of a single layered structure. Cavities 15 are comprised in the second buffer regions 10. The second buffer regions 10 having the cavities 15 are arranged between mutual first buffer regions 9 of the multilayered structure whereby the warpage of the semiconductor substrate is improved and the crystallinity of the main semiconductor region is improved. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006100501(A) |
申请公布日期 |
2006.04.13 |
申请号 |
JP20040283567 |
申请日期 |
2004.09.29 |
申请人 |
SANKEN ELECTRIC CO LTD |
发明人 |
RI TEISHIYOKU;SUGAWARA TOMOYA |
分类号 |
H01L29/812;H01L21/205;H01L21/338;H01L29/778;H01L33/12;H01L33/32;H01L33/34 |
主分类号 |
H01L29/812 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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