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发明名称
TEST BOARD OF SEMICONDUCTOR TESTER HAVING MODIFIED I/O PRINTED CIRCUIT PATTERN AND METHOD FOR TESTING THEREOF
摘要
申请公布号
KR20060029841(A)
申请公布日期
2006.04.07
申请号
KR20040078692
申请日期
2004.10.04
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
KIM, YONG WOON;BANG, JEONG HO;SHIM, HYUN SEOP;PARK, WOO IK
分类号
G01R31/28
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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