发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a polishing method for stably performing polishing even if the temperature on the surface of a polishing pad varies for each processing. <P>SOLUTION: A mechanism for supplying an abrasive 15 to the surface of the polishing pad 12 which is stuck to a surface plate 11 to perform polishing while pressing a substrate 13 comprises a mechanism 16 for measuring the surface temperatures of the polishing pad 12 during polishing, and a unit for collecting the measured surface temperatures to calculate the average value and the integration value during polishing processing. When the average and integration values fall below a predetermined reference value, the polished substrate is identified. The management of polishing amount by means of the average and integration values of the surface temperatures enables the stable polishing even with variations in the surface temperatures of the polishing pad. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006093180(A) 申请公布日期 2006.04.06
申请号 JP20040272852 申请日期 2004.09.21
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MATSUMOTO SATORU;KURIMOTO YUICHI
分类号 H01L21/304;B24B37/015 主分类号 H01L21/304
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